Singapore
& Kuala Lumpur
 
 
 
Defect Prevention
One Day Workshop
Overview

Defect prevention is aimed at optimizing development process to reduce costs, improve productivity and quality.

Concepts of defect prevention is designed teach the participants with the concepts of defects and prevention techniques. The course is aligned with the models and standards like CMM, CMMI and Six sigma.

This one day course introduces the fundamentals of defects, origin of defects, defects finding techniques, defects classification and causal analysis and resolution to prevent defects.

Concepts of metrics related to defects and defect prevention, usage of statistical tools and techniques are detailed in the course. The course enriches the knowledge of participants through practical case studies.

Workshop Abstract
  • Introduction to defect prevention
  • Concepts of defects and origin of defect
  • Classification of defects
  • Techniques to find defects
  • Defect prevention metrics and measurements
  • Causal analysis and resolution
  • Statistical tools and techniques in defect prevention
  • CMM, CMMI and Six Sigma: Defect prevention
  • Case studies
CMM® and Capability Maturity Model are registered in the US Patent and Trademark office.SEI(SM), CMMI(SM), Capability Maturity Model Integration(SM), SEPG(SM), PSP(SM), SCAMPI(SM), TSP(SM), are service marks of Carnegie Mellon University.

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